mPulse LEA - Laser Elemental Analyzer
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The LEA is the first truly hand-held laser based elemental analyzer. Unlike XRF systems it uses completely harmless, non-ionizing radiation for analysis. And, unlike arc-spark systems, both conducting and non-conducting samples can be measured. Reference files for various materials can be pre-installed or added by the user. Applications include forensics, RoHS compliance testing, mining, provenance, and many more.
Download the LEA brochure here
Contact the Active Optical Sensing business unit to discuss the LEA.
Features
Specifications
- Rapid analysis time - about 1 second
- No sample preparation required
- Light and heavy elements analyzed equally well.
- Simple point and shoot operation
- Nearly any solid material can be analyzed
Laser
Wavelength
Average power
1064 nanometers
< 500 mW (Class 3b)
Analytical optics
Miniature Czerny-Turner spectrometer
Power
Battery pack
Charger
12 V, 1.1 Ah
Output 16 V, 4A
Input 100-240 VAC
Dimensions
Weight
Dimensions
Environmental
Operating temp.
Humidity
1.75 kg
226 x 90 x 293 mm
-10 to +40 C
non-condensing
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